“Semiconductors industry and its derivative applications in which Si Automation evolves today in an international context, already represents a field of privileged investigations for GPC. ”

“The follow-up by multivariate methods seems to me very interesting and the recent developments reassure me in this direction. In addition, the ergonomics of the results are in line with our operational needs.”

“The GPC developed by Mr. Daniel Lafaye de Micheaux makes it possible to go even further in identifying the signature of an out of control process, with a permanent learning mode.”

“The GPC method constitutes a coherent set of indicators in order to detect and describe the effects of the operating process anomalies.”

“It is possible to prevent the reappearance of a defect already observed by the simple creation of specific card specific to the defect, impossible action with the classical control cards.”